JIS B 7502 PDF

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In the event of any doubts arising as to the contents, the original JIS is to be the final authority. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. Annex C informative Typical data sheet for design specification design characteristics , metrological characteristics and performance Attention is drawn to the possibility that some parts of this Standard may conflict with patent rights, applications for a patent after opening to the public or utility model rights.

The relevant Minister and the Japanese Industrial Standards Committee are not responsible for identifying any of such patent rights, applications for a patent after opening to the public or utility model rights.

Introduction This Japanese Industrial Standard has been prepared based on the second edition of ISO published in with some modifications of the technical contents in order to correspond to the practical manufacture and use. The portions given sidelines or dotted underlines are the matters in which the con- tents of the corresponding International Standard have been modified.

A list of modi- fications with the explanations is given in Annex JB. The most recent editions of the standards in- cluding amendments indicated below shall be applied. NOTE 2 Usually, micrometers for external measurements have a thread as a material measure with the anvil, spindle and screw mechanism ar- ranged linearly.

NOTE 1 An adjusting anvil and an anvil fixed on the spindle have a spherical. NOTE 2 Micrometers for internal measurements have a screw thread as a mate- rial measure with the adjusting anvil, anvil, spindle and screw mecha- nism arranged linearly.

NOTE 2 The micrometer head has the spindle and screw mechanism arranged linearly. The figures are intended to indicate the names but not intended to give the design. Table 1 N ames of micrometer Main parts Classifica tion shown in: Micrometer for external Figure 1 measurements Micrometer for internal Figure 2 measurements Micrometer for span Figure 3 measurements of teeth Micrometer head Figure 4.

The clearance between the spindle and the guide hole of micrometer for external. Dimensions Nominal value Anvil length, Ll -. Measuring span, L4 25 mm a Frame depth, L5 b -. Spindle and anvil diameter, Dl 6. Notes a At the manufacturer's discretion. Other diameters are possible. Unit: mm. Figure 5 Radius of curvature of measuring face of micrometer for internal measurements. Maximum measurable dimension D T 50 or under 15 to 20 0.

Table 4 Clearance between a spindle and its guide hole. Table 5 Types of measuring ranges Unit: mm Measuring range Micrometer for ex- Micrometer for in- Micrometer for span Micrometer head ternal measure- ternal measure- measurements of ments ments teeth o to 25 - o to 25 o to 25 25 to 50 25 to 50 50 to 75 50 to 75 50 to 75 75 to 75 to 75 to to to to to to to to to to to to to to to to to to to to to to -.

On micrometers with a digital indicating device, the unit of the indication shall be labelled. NOTE: Combinations of analogue and digital indicating devices are possible. In the case of micrometers with spindles having a pitch of 0. The secondary scale on the thimble shall have a scale graduated with 50 pitch 0. Sleeve Thimble Sleeve Thimble a 0.

Thimble graduation line NOTE: The thickness of thimble graduation line should be equal to that of sleeve fiducial line. Unit: mm 3 4 1. Figure 8 Arrangement between main scale and secondary scale, and the dimensions of thimble scales. The mechanical dig- ital display shall have a digital step of 0. The digits of the display shall provide a good contrast with the background. The electronic digital display shall have a digital step of 0.

Figure 10 Example of electronic digital display. For hand-held micrometers, the frame. The measuring force generated by the measuring-force limiting device shall be measured as given in 5. Usually, the micrometers have a measuring force between 5 Nand An adjustment device shall be provided to compensate for wear of the spindle and nut threads.

NOTE 1 To set the reference point, the reference point setting bars or gauge blocks should be used. NOTE 2 The dimensional tolerance on nominal dimension of reference point set- ting bar is obtained by the following formula.

The measurement standard shall be able to measure the metrological characteristics and performance of a mI- crometer over the whole measuring range. The indication shall not change by more than 2! The tolerance on error of indication shall be limited by the maximum permissible error MPE.

The full surface contact error refers to the error of indication when full measur- ing face contact 3. If the minimum measurable dimension is not zero, that value plus the dimen- sion corresponding to the minimum measurable dimension are the preferable gauge block dimension. NOTE: Using the error-of-indication curve is the easest method to evaluate the performance of a micrometer, and the effective method to verify the measurement result.

An example of an error-of-indication curve is given in Annex A. Table 9 Measurement of full surface contact error Type Measuring method Figure Measuring instruments Microme- After setting the reference Gauge block ter for point using measuring- of grade 0 external force limiting device with or 1 speci- meas- the minimum measurable fied in JIS urements dimension of a micrometer, B , or place each gauge block of a the gauge selected length between equal or measuring faces.

Subtract superIOr the gauge block dimension thereto from the indication of the micrometer using the same device. Microme- Method 1 Gauge block ter for in- Bring two flat jaws Type of grade 0 ternal A into close contact with or 1 speci- meas- the gauge block having the Flat jaw fied in JIS urements nominal dimension equal to Type A B , or the minimum measurable gauge equal dimension of the microme- or supenor ter, and fix them with a thereto Micrometer gauge block holder.

Set the reference point of the mi- crometer by measuring the distance between the two faces, and measure the di- Flat jaw 'fL Subtract the gauge block dimension from the indica- tion of the micrometer. Then ad- 11m as spec- just the scale of the mi- ified in JIS crometer to any indication, B , or clamp it, and measure the length length with the length meaSUring measuring instrument. Add instrument the minimum measurable having an dimension to the indication accuracy of the length measuring in- equal or strument at that time.

Subtract the gauge block dimension from the indication of the micrometer using the same device. Table 9 concluded Type Measuring method Figure Measuring instruments Microme- Method 2 Length ter head Measure the spindle screw meaSUring conclud- feed of the micrometer instrument ed head by the length meas- having the uring instrument. This is the closeness of agreement between the results of successive measurements of the same measurand under the same conditions of measurement, when a full measur- ing face contact 3.

The repeatability shall be measured, for example by using gauge blocks having any dimension within the measuring span. The error of indication applies when partial measuring face contact 3.

Table 10 Performance of micrometer for external measurements Unit: f. Table 11 Performances of micrometer for internal measurements Unit: 11m Measuring range mm I Spindle screw feed error max. I 3 Performance of micrometer having other measuring ranges shall be as agreed between the parties con- cerned with delivery.

Table 12 Performance of micrometer for span measurements of teeth Unit: 11m Measuring Flatness Parallel- Spindle Frame deflection range mm of meas- ism of screw feed per 10 N uring face meaSUring error face o to 25 1 4 3 2 25 to 50 50 to 75 6 3 75 to to 1.

Table 13 Performance of micrometer heads Unit: J. Table 14 Measurement of flatness of measuring face Type Measuring methods Figure Measuring instruments Micrometer Bring an optical flat or op- Optical flat of for external tical parallel into close con- grade 1 or 2 measure- tact with the measuring specified in ments, face, and count the number JIS B , or micrometer of red interference fringes optical paral- for span produced by the white light.

Optical flat lel of grade 1 measure- Count a red interference or specified in ments of fringe as 0. Table 15 Measurement of parallelism of measuring face Type Measuring methods Figure Measuring instruments Microm- Method 1 Optical par- eter for Bring a combination of gauge allelof external block and optical parallel, or grade 1 meas- optical parallel into close con- specified in urements tact with the measuring face JIS B , of the anvil to the degree that Optical parallel and gauge a single colour or closed curve block of of interference fringe is ob- Gauge block grade 0 or 1 served.

Count the number of specified in red interference fringes pro- JIS B , duced by the white light on or gauge the measuring face of a spin- Optical parallel equal or su- dIe using a measuring-force perior limiting device of the microm- thereto eter' and take it as a parallel- ism. It is preferable to obtain the maximum value of succes- sive measurements both at the position of integer rota- tions of the spindle and at more than one position where the fraction of number of rota- tions equals to the multiple of a fraction of one rotation.

When the maximum measur- able dimension exceeds mm, Method 2 may be used. Table 15 concluded Type Measuring methods Figure Measuring instruments Microm- Method 2 Gauge block eter for Place a gauge block in the of grade 0 or external centre of both measuring fac- 1 specified meas- es, and read the indication Gauge blocks in JIS B urements using a measuring-force lim- , or conclud- iting device of the micrometer. Measur- Alternatively, bring the gauge ing face block equal to the minimum The mark x represents measurable dimension into a measuring point.

Place separately another gauge blocks between the gauge block and the spindle me as - uring face, in centre and four corners of the measuring face. Read each indication, and ob- tain the maximum difference. Microm- Place separately gauge blocks Gauge block eter for in four corners of measuring of grade 0 or span face, read each indication us- 1 specified meas- ing a measuring-force limiting in JIS B urements device of the micrometer, and , or of teeth obtain the maximum differ- gauge equal ence.

Read each in- dication, and obtain the maximum difference. In the case of the micrometer for external measurements having the maximum meas- urable dimension of mm or less, the difference between the maximum and the mini- mum of the full surface con- tact error Table 9 may be obtained. Microm- Determine the difference be- eter head tween the maximum and the minimum of the full surface contact error at each measur- able dimension obtained by the method in Table 9.

Arrange the spindle and val 20 g or meas- the balance so that the spindle less, or urements axis is vertical and the bal- equivalent of teeth, ance indicates zero. Repeat this procedure five times, and average the values. Table 18 Measurement of measuring force dispersion Type Measuring method Figure Measuring instruments Microm- Obtain the difference between Same as Table 1 7 Same as Ta- eter for the maximum and the mini- ble 17 external mum of measuring force ob- meas- tained by the method of ure- 5.

Table 19 Measurement of frame deflection Type Measuring method Figure Measuring instruments Microm- Aim the anvil of a micrometer Reference eter for downward and secure the mi- point setting external crometer with the spindle axis bar or other meas- kept vertical. Obtain the frame deflection per ION from the difference between two indications.

JIS B , Move the V-block, and read or length the indication of an electrical meaSUring comparator when the meas- instrument uring face is applied to the of an accu- stopper. V block racy at least Read separately the indica- equivalent tions of the electrical com par- thereto ator, and take a half the maximum difference of indica- tions as a perpendicularity. Method 2 Autocolli- Rotate the spindle of a mi- mator speci- crometer head, read the fied in JIS B runout of measuring face us- Autocollimator When such a measurement standard is not available, the one traceable to national standards shall be used.

For the micrometers with measuring faces of anvil and spindle made of cemented carbide alloys, the measurements of hardnesses may be omitted. Annex A informative Example of an error-of-indication curve. Figure A. This is a simplified da- ta set for data points in order to illustrate the characteristics of the micrometer. The details of indicating and specifying metrological characteristics are specified in. Symbol L length indication J error of indication h error-of-indication span c.

I Error-of-indication curve. Annex B informative Notes on use.

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JIS B 7502, B7507 - what are these standards and where/how to use them?

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JIS B 7502

BBMitutoyo reserves the right to change any or all aspects of any product specication, including prices, designs and service content, without notice. The verication of conformity and nonconformity to the specications is clearly stipulated to use the internationally recognized acceptance criteria simple acceptance when the specication range equals the acceptance range, and it is accepted that the specication range equals the acceptance range if a given condition considering uncertainty is met. The following describes the standard inspection method including the revised content of JIS The total measuring surface contact error of the outside micrometer is an indication error measured by contacting the entire measuring surface with the object to be measured at an arbitrary point in the measuring range. The value can be obtained by adjusting the reference point using a constant pressure device with the minimum measuring length of the micrometer, inserting a grade 0 or 1 gage block prescribed in JIS B or an equivalent or higher gage between the measuring surfaces Fig.

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